Special Issue on the 2011 IEEE International Instrumentation and Measurement Technology Conference.

Yong Yan Ruth A. Dyer

Published in: IEEE Trans. Instrum. Meas. (2012)

Keyphrases

special issue
ai edam
applied intelligence
ecml pkdd
international journal
special section
selected papers
conference proceedings
computer society
data acquisition
case study
advanced technology
information systems
advances in artificial intelligence
nsf funded
soft computing
national research council