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Investigation of the data retention mechanism and modeling for the high reliability embedded split-gate MONOS flash memory.

Yoshiyuki KawashimaTakashi HashimotoIchiro Yamakawa
Published in: IRPS (2015)
Keyphrases
  • high reliability
  • data sets
  • database
  • training data
  • data structure
  • data points
  • data mining
  • data sources
  • data distribution
  • data analysis
  • training set
  • storage systems
  • solid state