Characterization of Ten-Mode EDFA Using Swept Wavelength Interferometer and Digital Holography.
Yetian HuangHanzi HuangYan WuHaoshuo ChenJianxiang WenLauren DallachiesaNicolas K. FontaineCheng GuoMikael MazurRené-Jean EssiambreYingxiong SongTingyun WangRoland RyfPublished in: OFC (2024)