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Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies.

Thomas RousselinG. HubertDidier RegisMarc GattiA. Bensoussan
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • error rate
  • test set
  • power consumption
  • misclassification rate
  • lower error rates
  • rule sets
  • word error rate
  • classification accuracy
  • low resolution
  • text entry