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FDSOI and Bulk CMOS SRAM Cell Resilience to Radiation Effects.
Walter E. Calienes Bartra
Andrei Vladimirescu
Ricardo Augusto da Luz Reis
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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power consumption
random access memory
low power
high speed
low cost
x ray
infrared
low voltage
vlsi circuits
neural network
power management
microscopic images