Two lattice metrics dendritic computing for pattern recognition.

Gerhard X. Ritter Gonzalo Urcid Juan Carlos Valdiviezo-N.

Published in: FUZZ-IEEE (2014)

Keyphrases

pattern recognition
neural network
computer vision
signal processing
image processing
real world
machine learning
rough sets
database
information retrieval
feature extraction
bayesian networks
image analysis
evaluation metrics