Editorial: Special Issue on Reliable Machine Learning and Optimization.
Nian ZhangJian WangLeszek RutkowskiPublished in: Int. J. Artif. Intell. Tools (2022)
Keyphrases
- special issue
- machine learning
- applied intelligence
- ai edam
- international journal
- ecml pkdd
- optimization approaches
- optimization algorithm
- machine learning algorithms
- information extraction
- special section
- pattern recognition
- global optimization
- data analysis
- learning tasks
- data mining
- computer vision
- decision trees
- optimization method
- text classification
- optimization problems
- future directions
- researchers and practitioners
- computational intelligence
- text mining
- knowledge discovery
- learning algorithm
- expert systems