Redundant transformations for BIST testability metrics-based data path allocation.
Laurence Tianruo YangJon C. MuzioPublished in: APCCAS (2) (2002)
Keyphrases
- data analysis
- data sets
- database
- data structure
- data processing
- machine learning
- noisy data
- raw data
- data collection
- data mining techniques
- knowledge discovery
- historical data
- sensor data
- image data
- data points
- data sources
- probability distribution
- prior knowledge
- statistical analysis
- synthetic data
- high dimensional
- spatial data
- application domains
- experimental data
- network structure
- high quality
- learning algorithm
- data quality
- neural network