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MIMO Detection Under Hardware Impairments: Learning With Noisy Labels.
Jinman Kwon
Seunghyeon Jeon
Yo-Seb Jeon
H. Vincent Poor
Published in:
IEEE Trans. Wirel. Commun. (2024)
Keyphrases
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learning process
data sets
pairwise
low cost
online learning
knowledge acquisition
neural network
machine learning
training data
prior knowledge
supervised learning
learning systems
quality metrics