Optical methods for the analysis of residual stresses and measurement of displacements in the nanometric range.
Giancarlo PedriniVenancio Martínez-GarcíaP. WeidmannA. SinghWolfgang OstenPublished in: INDIN (2016)
Keyphrases
- field of view
- wide range
- significant improvement
- computational cost
- empirical studies
- database
- complexity analysis
- optimization methods
- benchmark datasets
- statistical analysis
- finite element model
- classification method
- multiresolution
- preprocessing
- computational complexity
- image segmentation
- image processing
- search engine
- neural network