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Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits.
Liewei Xu
Chang Cai
Tianqi Liu
Lingyun Ke
Jun Yu
Chang Wu
Published in:
IEICE Electron. Express (2019)
Keyphrases
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integrated circuit
database
design process
formative evaluation
design space
data sets
design tools
image analysis
efficient implementation
engineering design
user centered
formal verification
printed circuit boards
assessment tool