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Multi-resolution based sensitivity analysis of complex non-linear circuits.
Sami Barmada
Antonino Musolino
Rocco Rizzo
Mauro Tucci
Published in:
IET Circuits Devices Syst. (2012)
Keyphrases
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sensitivity analysis
multiresolution
managerial insights
influence diagrams
variational inequalities
highly non linear
wavelet transform
complex systems
wavelet domain
logic circuits
high level
objective function
low cost
higher level
complex data