Login / Signup
Development of a High Resolution Topography and Color Scanner to Capture Crack Patterns of Paintings.
Mathijs J. W. van Hengstum
Tessa T. W. Essers
Willemijn S. Elkhuizen
Dimitra Dodou
Yu Song
Jo M. P. Geraedts
Joris Dik
Published in:
GCH (2018)
Keyphrases
</>
high resolution
digital images
color images
software engineering
case study
high resolution color
super resolution
low resolution
color correction
color space
association rules
pattern mining
design patterns
pattern discovery
spatial resolution
single image
ccd camera
color image processing