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Efficient Yield Analysis for SRAM and Analog Circuits using Meta-Model based Importance Sampling Method.

Xiao ShiHao YanJiajia ZhangQiancun HuangLongxing ShiLei He
Published in: ICCAD (2019)
Keyphrases
  • analog circuits
  • statistical analysis
  • artificial intelligence
  • neural network
  • data analysis
  • state space
  • meta level