Measurement uncertainty in the presence of low-frequency noise.
Panu HelistöHeikki SeppäPublished in: IEEE Trans. Instrum. Meas. (2001)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet transform
- measurement error
- wavelet analysis
- original images
- electromagnetic fields
- subband
- wavelet coefficients
- high frequency components
- discrete wavelet transform
- low pass
- visual quality
- dct domain
- frequency band
- dct coefficients
- high resolution
- high quality
- contourlet transform
- sensor noise
- subband decomposition