Opportunities and Challenges of Tunnel FETs.

Rahul Pandey Saurabh Mookerjea Suman Datta

Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2016)

Keyphrases

lessons learned
image processing
high speed
preprocessing
trade off
key issues
application scenarios
open questions
database
real time
learning algorithm
case study
high level
evolutionary algorithm
technical challenges
short and long term