Yield prediction by sampling IC layout.

Gerard A. Allan

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2000)

Keyphrases

high dimensional
prediction accuracy
random sampling
prediction model
neural network
real time
case study
prediction algorithm
sample size
monte carlo
machine learning
high prediction accuracy
sampling strategies
integrated circuit
markov chain
active learning
expert systems
data structure
website
computer vision