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Analysing inspection frequency for wafer bumping process and an empirical study of UNISON decision framework.
Chen-Fu Chien
Chih-Han Hu
Chi-Yung Lin
Published in:
Int. J. Manuf. Technol. Manag. (2008)
Keyphrases
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main contribution
decision process
process model
information retrieval
artificial intelligence
image processing
multiscale
hidden markov models
lightweight
decision model
learning algorithm
decision making
design process
decision rules