A function-fit model for the hard breakdown I-V characteristics of ultra-thin oxides in MOS structures.
Enrique MirandaB. BrandalaPublished in: Microelectron. Reliab. (2005)
Keyphrases
- computational model
- mathematical model
- network model
- neural network
- high level
- formal model
- experimental data
- spatial structure
- database
- prediction model
- bayesian framework
- probability distribution
- case study
- input data
- theoretical analysis
- management system
- cost function
- hierarchical structure
- artificial neural networks
- objective function
- feature selection
- machine learning