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RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology.

Christophe KelmaSébastien DarfeuilleAndreas NeuburgerAndreas Lobnig
Published in: ETS (2013)
Keyphrases
  • radio frequency
  • cmos technology
  • low power
  • real time
  • pattern recognition
  • signal processing
  • power dissipation
  • computer vision
  • power consumption
  • spl times
  • low voltage