A Critical Embedded System Product Line Model-based Approach.
Paulo G. G. QueirozRosana T. V. BragaPublished in: SEKE (2014)
Keyphrases
- statistical model
- probabilistic model
- neural network
- case study
- mathematical model
- prior knowledge
- theoretical analysis
- management system
- learning algorithm
- high level
- artificial neural networks
- formal model
- database
- neural network model
- em algorithm
- access control
- maximum likelihood
- probability distribution
- information technology
- decision making
- social networks
- databases