A 3nm GAAFET Analog Assisted Digital LDO with High Current Density for Dynamic Voltage Scaling Mobile Applications.
Seki KimHyongmin LeeYongjin LeeDongha LeeByeongbae LeeJahoon JinSusie KimMiri NohKwonwoo KangSangho KimTakahiro NomiyamaJi-Seon PaekJongwoo LeePublished in: VLSI Technology and Circuits (2022)
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