Henshin: Advanced Concepts and Tools for In-Place EMF Model Transformations.
Thorsten ArendtEnrico BiermannStefan JurackChristian KrauseGabriele TaentzerPublished in: MoDELS (1) (2010)
Keyphrases
- formal model
- probability distribution
- computational model
- cost function
- multiscale
- high level
- objective function
- probabilistic model
- parameter estimation
- theoretical framework
- conceptual model
- genetic algorithm
- similarity measure
- machine learning
- management system
- theoretical analysis
- image segmentation
- statistical model