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Automated Backend Allocation for Multi-Model, On-Device AI Inference.
Venkatraman Iyer
Sungho Lee
Semun Lee
Juitem Joonwoo Kim
Hyunjun Kim
Youngjae Shin
Published in:
Proc. ACM Meas. Anal. Comput. Syst. (2023)
Keyphrases
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back end
machine learning
expert systems
management system
graphical models
similarity measure
query processing
probabilistic model
bayesian inference