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Technological process effects on SAW sensors devices characteristics and FEM estimation.

Maxence RubeCorinne DejousOllivier TamarinHamida HallilVeronique ConederaAdrian LabordeJean-Luc LachaudMartine SebeloueLaurent LinguetDominique Rebière
Published in: IEEE SENSORS (2019)
Keyphrases
  • neural network
  • learning algorithm
  • information systems
  • parameter estimation
  • infrared
  • ambient intelligence
  • process model
  • finite element
  • wearable devices