An Improved Method of ADC Jitter Measurement.
Yves LangardJean-Luc BalatJacques DurandPublished in: ITC (1994)
Keyphrases
- experimental evaluation
- computational cost
- high accuracy
- fully automatic
- computationally efficient
- significant improvement
- evaluation method
- segmentation method
- optimization algorithm
- main contribution
- optimization method
- preprocessing
- similarity measure
- detection method
- mathematical model
- image processing
- data sets
- support vector machine
- high order
- machine learning
- high precision
- classification method
- synthetic data
- detection algorithm
- support vector machine svm
- computational complexity
- feature set
- classification accuracy
- semi supervised