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Temperature dependence of the locked mode in a single-electron latch.

Ravi K. KummamuruMo LiuAlexei O. OrlovCraig S. LentGary H. BernsteinGregory L. Snider
Published in: Microelectron. J. (2005)
Keyphrases
  • electric field
  • data sets
  • neural network
  • database systems
  • evolutionary algorithm
  • probabilistic model