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Improving ESD protection of 5V NMOSFET large array device in 0.4μm BCD process.

Shao-Chang HuangHung-Wei ChenJen-Hang YangMi-Chang Chang
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • three dimensional
  • development process
  • database
  • multiscale
  • video sequences
  • search algorithm
  • process model