Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey.
Xian TaoXinyi GongXin ZhangShaohua YanChandranath AdakPublished in: IEEE Trans. Instrum. Meas. (2022)
Keyphrases
- deep learning
- unsupervised learning
- image database
- image features
- image retrieval
- deep architectures
- input image
- image classification
- test images
- unsupervised feature learning
- image regions
- segmentation method
- region of interest
- multiple images
- machine learning
- image annotation
- weakly supervised
- deep belief networks
- natural language processing