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Defects detection on TFT lines of flat panels using a feed forward neural network.
H. A. Abeysundara
Hiroshi Hamori
Takeshi Matsui
Masatoshi Sakawa
Published in:
Artif. Intell. Res. (2013)
Keyphrases
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line detection
object detection
detection accuracy
false positives
automatic detection
detection method
line segments
detection rate
hough transform
thin film transistor
false alarms
detection algorithm
real time
vision system
computer vision
liquid crystal displays
data sets