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A Novel High Voltage Drain Extended FinFET SCR for SoC Applications.

M. MonishmuraliMayank Shrivastava
Published in: IRPS (2021)
Keyphrases
  • high voltage
  • operating conditions
  • normal operation
  • data sets
  • partial discharge
  • knowledge base
  • small number
  • case based reasoning
  • genetic programming
  • low power
  • hardware and software