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Product Lifetime Estimation in 7nm with Large data of Failure Rate and Si-Based Thermal Coupling Model.
Jae-Gyung Ahn
Rhesa Nathanael
I-Ru Chen
Ping-Chin Yeh
Jonathan Chang
Published in:
IRPS (2021)
Keyphrases
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experimental data
prior knowledge
data sets
probabilistic model
data sources
probability distribution
input data
estimation process
network structure
data analysis
graphical models
parameter estimation
state space
infrared
em algorithm
data points
objective function
training data