Surge Energy Robustness of GaN Gate Injection Transistors.

Ruizhe Zhang Joseph P. Kozak Jingcun Liu Ming Xiao Yuhao Zhang

Published in: IRPS (2020)

Keyphrases

cmos technology
field effect transistors
energy minimization
short term
computational efficiency
database
real time
multiscale
long term
power consumption
energy saving
low energy
energy distribution
flip flops
nano scale