• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Noise Analysis of CMOS Ring Oscillator-based Capacitance Measurement for Lab-on-Chip Application.

Javed S. Gaggatur
Published in: SOCC (2022)
Keyphrases
  • high speed
  • low cost
  • analog vlsi
  • statistical analysis
  • low power
  • data acquisition
  • noise reduction
  • random noise
  • chip design
  • ultra low power