Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model.

Tianxu Zhao Yue Hao Peijun Ma Taifeng Chen

Published in: DFT (2001)

Keyphrases

probabilistic model
formal model
management system
graphical models
computational model
theoretical framework
mathematical model
software reliability
high level
reinforcement learning
prior knowledge
probability distribution
d objects
gaussian distribution
spatial distribution
power law