Device Designs and Analog Performance Analysis for Negative-Capacitance Vertical-Tunnel FET.
Hung-Han LinVita Pi-Ho HuPublished in: ISQED (2019)
Keyphrases
- high speed
- data conversion
- field effect transistors
- data acquisition
- low power
- positive and negative
- analog vlsi
- vlsi architecture
- artificial intelligence
- simulation model
- printed circuit
- unit length
- focal plane
- design space
- high frequency
- infrared
- multiscale
- image sequences
- portable devices
- e learning
- information systems