Maximal Margin Classification for Metric Spaces.
Matthias HeinOlivier BousquetPublished in: COLT (2003)
Keyphrases
- metric space
- maximal margin
- classification accuracy
- pattern recognition
- support vector
- searching in metric spaces
- feature extraction
- feature space
- svm classifier
- similarity search
- decision trees
- support vector machine
- image classification
- supervised learning
- generalization ability
- distance function
- support vector machine svm
- machine learning
- probability measures
- data structure
- partially ordered sets
- similarity queries
- model selection
- access methods
- multidimensional index
- hyperplane
- range queries
- loss function
- multi dimensional
- feature vectors
- training set
- database systems
- image processing
- learning algorithm