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Failure Analysis of Virtual and Physical Machines: Patterns, Causes and Characteristics.
Robert Birke
Ioana Giurgiu
Lydia Y. Chen
Dorothea Wiesmann
Ton Engbersen
Published in:
DSN (2014)
Keyphrases
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image analysis
special case
virtual environment
augmented reality
numerical analysis
decision making
image processing
optimal solution
pattern recognition
virtual reality
quantitative analysis
pattern analysis
root cause