Temperature monitoring inside IGBT modules at forward bias from the cross section and its finite element analysis.
Yongle HuangYifei LuoFei XiaoBinli LiuPublished in: Microelectron. Reliab. (2018)
Keyphrases
- cross section
- finite element analysis
- temperature field
- finite element
- cross sections
- cross sectional
- computer aided design
- monitoring system
- using artificial neural networks
- finite element model
- friction coefficient
- material properties
- experimental data
- artificial neural networks
- scaling function
- simulation software
- motion analysis
- theoretical analysis
- object oriented
- neural network
- stress distribution