Failure Mechanisms in Semiconductor Memory Circuits.

Ray Haythornthwaite

Published in: MTDT (2000)

Keyphrases

main memory
memory requirements
limited memory
semiconductor manufacturing
vlsi circuits
computing power
power dissipation
cognitive functions
real time
high speed
memory usage
root cause
short term memory
failure prediction
semiconductor devices
logic synthesis
failure detection
low power
building blocks
case study