A Hybrid Artificial Neural Network-Naive Bayes for solving imbalanced dataset problems in semiconductor manufacturing test process.
Asrul AdamLim Chun ChewMohd Ibrahim ShapiaiWen Jau LeeZuwairie IbrahimMarzuki KhalidPublished in: HIS (2011)
Keyphrases
- naive bayes
- decision trees
- semiconductor manufacturing
- classification accuracy
- training data
- text classification
- process control
- logistic regression
- cost sensitive
- machine learning
- imbalanced datasets
- feature selection
- probability estimation
- text categorization
- classification algorithm
- misclassification costs
- neural network
- bayesian networks