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Constant-Gate-Charge Scaling for Increased Short-Circuit Withstand Time in SiC Power Devices.
Madankumar Sampath
Dallas T. Morisette
James A. Cooper
Published in:
IRPS (2020)
Keyphrases
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short circuit
thin film
power dissipation
power consumption
low power
pattern recognition
embedded systems
genetic algorithm
mobile devices
rough sets