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Constant-Gate-Charge Scaling for Increased Short-Circuit Withstand Time in SiC Power Devices.

Madankumar SampathDallas T. MorisetteJames A. Cooper
Published in: IRPS (2020)
Keyphrases
  • short circuit
  • thin film
  • power dissipation
  • power consumption
  • low power
  • pattern recognition
  • embedded systems
  • genetic algorithm
  • mobile devices
  • rough sets