Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits.

Selahattin Sayil Sumanth R. Yeddula Juyu Wang

Published in: IEEE Des. Test (2013)

Keyphrases

high speed
analog vlsi
low cost
circuit design
neural network
delay insensitive
vlsi circuits
event detection
error correction
image processing
case study
artificial neural networks
power consumption
power dissipation