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Effect of Vth shifting in CMOS Transistors under radiation conditions when applying OBT: A case study.
Pablo A. Petrashin
Walter J. Lancioni
Agustin Laprovitta
Fortunato Dualibe
Juan Luis Castagnola
Published in:
LATS (2023)
Keyphrases
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medical images
power consumption
circuit design
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medical imaging
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case study
infrared
x ray
sufficient conditions
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cmos technology
analog vlsi
integrated circuit
high power
test bed
real time