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Evaluation of Deep Learning Model for Detecting Electronic Components in Few-Shot Learning Scenarios.
Allana Rocha
Bruno J. T. Fernandes
Leandro H. de S. Silva
Published in:
LA-CCI (2023)
Keyphrases
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deep learning
learning scenarios
probabilistic model
real world
expert systems
machine learning
image segmentation
bayesian networks
d objects
maximum likelihood
learning activities
object model