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Fundamental Limits of Erasure-Coded Key-Value Stores With Side Information.
Ramy E. Ali
Viveck R. Cadambe
Jaime Llorca
Antonia Maria Tulino
Published in:
IEEE Trans. Commun. (2020)
Keyphrases
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domain knowledge
computer systems
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structural information
machine learning
information sources
fundamental limits
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case study
information extraction
image quality
higher level
information processing
raw data