On-chip Jitter Measurement Using Vernier Ring Time-to-Digital Converter.

Jianjun Yu Fa Foster Dai

Published in: Asian Test Symposium (2010)

Keyphrases

data conversion
circuit design
phase locked loop
analog to digital converter
mixed signal
low cost
low power
high voltage
transfer function
packet loss
high speed
digital technologies
single chip
vlsi implementation
low voltage
control method
host computer
cmos image sensor
real time