Scenario-based test case generation for state-based embedded systems.

Wei-Tek Tsai L. Yu X. X. Liu A. Saimi Y. Xiao

Published in: IPCCC (2003)

Keyphrases

embedded systems
computing power
test case generation
low cost
embedded devices
resource limited
embedded software
hardware software
object oriented systems
field programmable gate array
consumer electronics
hw sw
real world
model checking
software systems
object oriented
cooperative
artificial intelligence