Two-degree-of-freedom control combining machine learning and extremum seeking for fast scanning quantum dot microscopy.
Michael MaiwormChristian WagnerRuslan TemirovF. Stefan TautzRolf FindeisenPublished in: ACC (2018)
Keyphrases
- machine learning
- machine learning methods
- control system
- pattern recognition
- machine learning algorithms
- knowledge acquisition
- computer science
- image analysis
- learning systems
- high throughput
- knowledge discovery
- machine learning approaches
- decision trees
- computational intelligence
- inductive learning
- image enhancement
- adaptive control
- quantum inspired
- model selection
- text classification
- neural network
- data analysis
- natural language
- image processing
- data mining