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Test Time Reduction of 3-D Stacked ICs Using Ternary Coded Simultaneous Bidirectional Signaling in Parallel Test Ports.
Iftikhar A. Soomro
Mohammad Samie
Ian K. Jennions
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
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neural network
machine learning
artificial intelligence
information systems
case study
database systems
similarity measure
mobile robot
parallel processing